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electrostatic Archives - The Triz Journal

TRIZ Application In Device & Manufacturing Electrostatic Discharge Control

05/06/2006 |

Teong-San Yeoh Intel Technology Sdn. Bhd. Penang, Malaysia ts.yeoh@intel.com

ABSTRACT Electrostatic Discharge (ESD) is a common failure mechanism found in semiconductor device manufacturing. ESD can be generated from humans, machines or even during the handling of these semiconductor devices. This … Read More